| Titre : | Circuit design for reliability | | Type de document : | texte imprimé | | Auteurs : | Ricardo Reis, Auteur ; Yu Cao, Auteur ; Gilson Wirth, Auteur | | Editeur : | New York : Springer-Verlag | | Année de publication : | 2015 | | Importance : | 272 p. | | Présentation : | couv. ill. en coul., ill. | | Format : | 23 cm. | | ISBN/ISSN/EAN : | 978-1-461-44077-2 | | Langues : | Anglais (eng) | | Catégories : | ELECTRONIQUE
| | Index. décimale : | 09-08 Microélectronique | | Résumé : | This book presents physical understanding, modeling and simulation, on-chip characterization, layout solutions, and design techniques that are effective to enhance the reliability of various circuit units. The authors provide readers with techniques for state of the art and future technologies, ranging from technology modeling, fault detection and analysis, circuit hardening, and reliability management. | | Note de contenu : | Contents:
1-Introduction
2-Recent Trends in Bias Temperature Instability
3-Charge Trapping Phenomena in MOSFETS: From Noise to Bias Temperature Instability
4-Atomistic Simulations on Reliability
5-On-Chip Characterization of Statistical Device Degradation
6-Compact Modeling of BTI for Circuit Reliability Analysis
7-Circuit Resilience Roadmap
8-Layout Aware Electromigration Analysis of Power/Ground Networks
9-Power-Gating for Leakage Control and Beyond
10-Soft Error Rate and Fault Tolerance Techniques for FPGAs
11-Low Power Robust FinFET-Based SRAM Design in Scaled Technologies
12-Variability-Aware Clock Design |
Circuit design for reliability [texte imprimé] / Ricardo Reis, Auteur ; Yu Cao, Auteur ; Gilson Wirth, Auteur . - New York : Springer-Verlag, 2015 . - 272 p. : couv. ill. en coul., ill. ; 23 cm. ISBN : 978-1-461-44077-2 Langues : Anglais ( eng) | Catégories : | ELECTRONIQUE
| | Index. décimale : | 09-08 Microélectronique | | Résumé : | This book presents physical understanding, modeling and simulation, on-chip characterization, layout solutions, and design techniques that are effective to enhance the reliability of various circuit units. The authors provide readers with techniques for state of the art and future technologies, ranging from technology modeling, fault detection and analysis, circuit hardening, and reliability management. | | Note de contenu : | Contents:
1-Introduction
2-Recent Trends in Bias Temperature Instability
3-Charge Trapping Phenomena in MOSFETS: From Noise to Bias Temperature Instability
4-Atomistic Simulations on Reliability
5-On-Chip Characterization of Statistical Device Degradation
6-Compact Modeling of BTI for Circuit Reliability Analysis
7-Circuit Resilience Roadmap
8-Layout Aware Electromigration Analysis of Power/Ground Networks
9-Power-Gating for Leakage Control and Beyond
10-Soft Error Rate and Fault Tolerance Techniques for FPGAs
11-Low Power Robust FinFET-Based SRAM Design in Scaled Technologies
12-Variability-Aware Clock Design |
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